Lecture 4
18-322 Fall 2003
Textbook: Design Methodology Insert A
[Portions adapted from J. P. Uyemura “Introduction to VLSI Circuits and Systems”, Wiley 2001.]
The document provides an overview of analog layout design. It discusses that analog circuits require careful attention to geometry during layout due to process variations. The analog design flow includes electrical design, physical design involving layout, and fabrication/testing. Key considerations for analog layout include minimizing parasitic resistances and capacitances, reducing noise, and ensuring matching between identical components using techniques like common-centroid layout. Resistors and capacitors must be carefully laid out to minimize non-ideal effects and provide accurate values.
This presentation discusses the Lambda based design rules for drawing the layouts. The spacing between ltwo layers, extent if of overlap, minimum dimensions of each layer etc are decided by the lambda based design rules. the separation between metal and poly, poly and diffusion , width of metal etc
This document discusses designing combinational logic circuits using static complementary CMOS design. It explains how to construct static CMOS circuits for logic gates like NAND and NOR by using pull-up and pull-down networks of PMOS and NMOS transistors respectively. Issues related to pass-transistor design like noise margins and static power consumption are also covered. The document provides details on implementing various logic functions using pass-transistor logic and differential pass-transistor logic. It discusses solutions to overcome the disadvantages of pass-transistor logic like level restoration and use of multiple threshold transistors.
The document discusses stick diagrams and design rules for VLSI layout. It begins by explaining stick diagrams, which provide topological information to represent circuits between the schematic and layout levels. Examples of stick diagrams for CMOS inverters and other gates are shown. The document then covers design rules, which specify geometries and spacing to optimize yield and reliability. Examples of minimum widths, spacings, and other rules are discussed. The end discusses layout verification using techniques like DRC, LVS, and extraction to check for errors and ensure consistency between schematic and layout.
This presentation discusses the basics of Pass Transistor Logic, its advantages, limitation and finally implementation of Boolean functions/Combinational Logic circuits using Pass Transistor Logic.
Nanometer layout handbook at high speed designMinho Park
I made this contents for whom is about to layout own's IC design. I think it would be helpful to consider layouts about high speed Rx / Tx.
Specially it was aimed giga hertz bandwidth I/O with its ESD protection (I am still working on that items to rearrange with my knowledge to my experiences)
I showed up all references and all images (except originals) are belong to own's copy rights.
This document discusses the layout of analog CMOS integrated circuits. It focuses on the layout of transistors and basic cells. Key topics covered include:
- Layout of a single transistor, use of multiple fingers, and interdigitated transistors for matching.
- Common centroid layouts and dummy devices to reduce mismatch.
- Ensuring matched interconnect resistance, capacitance, and parasitics.
- Stacked layout of analog cells with stick diagrams to represent multiple transistors.
- Two examples of laying out basic cells - a two-stage op-amp and folded cascode. Design considerations like transistor sizing and grouping are discussed.
This document presents a new CMOS voltage divider based current mirror and compares it to basic and cascode current mirrors. The basic current mirror has limitations like finite output resistance and channel length modulation effects. The cascode current mirror improves output resistance but wastes threshold voltage. The new CMOS voltage divider current mirror uses an NMOS and PMOS transistor voltage divider to bias an NMOS transistor and control the output current. It consumes less power than the basic current mirror and is well-suited for low current biasing applications.
The document provides an overview of analog layout design. It discusses that analog circuits require careful attention to geometry during layout due to process variations. The analog design flow includes electrical design, physical design involving layout, and fabrication/testing. Key considerations for analog layout include minimizing parasitic resistances and capacitances, reducing noise, and ensuring matching between identical components using techniques like common-centroid layout. Resistors and capacitors must be carefully laid out to minimize non-ideal effects and provide accurate values.
This presentation discusses the Lambda based design rules for drawing the layouts. The spacing between ltwo layers, extent if of overlap, minimum dimensions of each layer etc are decided by the lambda based design rules. the separation between metal and poly, poly and diffusion , width of metal etc
This document discusses designing combinational logic circuits using static complementary CMOS design. It explains how to construct static CMOS circuits for logic gates like NAND and NOR by using pull-up and pull-down networks of PMOS and NMOS transistors respectively. Issues related to pass-transistor design like noise margins and static power consumption are also covered. The document provides details on implementing various logic functions using pass-transistor logic and differential pass-transistor logic. It discusses solutions to overcome the disadvantages of pass-transistor logic like level restoration and use of multiple threshold transistors.
The document discusses stick diagrams and design rules for VLSI layout. It begins by explaining stick diagrams, which provide topological information to represent circuits between the schematic and layout levels. Examples of stick diagrams for CMOS inverters and other gates are shown. The document then covers design rules, which specify geometries and spacing to optimize yield and reliability. Examples of minimum widths, spacings, and other rules are discussed. The end discusses layout verification using techniques like DRC, LVS, and extraction to check for errors and ensure consistency between schematic and layout.
This presentation discusses the basics of Pass Transistor Logic, its advantages, limitation and finally implementation of Boolean functions/Combinational Logic circuits using Pass Transistor Logic.
Nanometer layout handbook at high speed designMinho Park
I made this contents for whom is about to layout own's IC design. I think it would be helpful to consider layouts about high speed Rx / Tx.
Specially it was aimed giga hertz bandwidth I/O with its ESD protection (I am still working on that items to rearrange with my knowledge to my experiences)
I showed up all references and all images (except originals) are belong to own's copy rights.
This document discusses the layout of analog CMOS integrated circuits. It focuses on the layout of transistors and basic cells. Key topics covered include:
- Layout of a single transistor, use of multiple fingers, and interdigitated transistors for matching.
- Common centroid layouts and dummy devices to reduce mismatch.
- Ensuring matched interconnect resistance, capacitance, and parasitics.
- Stacked layout of analog cells with stick diagrams to represent multiple transistors.
- Two examples of laying out basic cells - a two-stage op-amp and folded cascode. Design considerations like transistor sizing and grouping are discussed.
This document presents a new CMOS voltage divider based current mirror and compares it to basic and cascode current mirrors. The basic current mirror has limitations like finite output resistance and channel length modulation effects. The cascode current mirror improves output resistance but wastes threshold voltage. The new CMOS voltage divider current mirror uses an NMOS and PMOS transistor voltage divider to bias an NMOS transistor and control the output current. It consumes less power than the basic current mirror and is well-suited for low current biasing applications.
The document discusses circuit design processes and stick diagrams. It begins by introducing MOS layers and objectives of understanding stick diagrams, design rules, and layout. It then covers stick diagrams in depth, explaining that they show relative component placement and layer information through color codes as an interface between symbolic circuits and layouts. Examples of stick diagram rules, notations, and common MOS circuits are provided. Finally, it discusses design rules, explaining that they define feature sizes and spacings to interface between circuits and fabrication processes while allowing for manufacturing tolerances.
FPGA are a special form of Programmable logic devices(PLDs) with higher densities as compared to custom ICs and capable of implementing functionality in a short period of time using computer aided design (CAD) software....by mathewsubin3388@gmail.com
The document describes the CMOS design and fabrication process. Key points include:
- CMOS uses complementary n-type and p-type MOS transistors to reduce power consumption.
- Transistors are built on a silicon substrate using dopants to create n-type and p-type regions. PN junctions form diodes and MOS capacitors.
- The CMOS fabrication process involves layering and patterning of silicon, oxides, and metals through steps like oxidation, lithography, etching, and doping.
This document discusses SPICE (Simulation Program with Integrated Circuit Emphasis) and PSpice, a version of SPICE used for circuit simulation on PCs. It describes the basic steps for simulating a circuit using PSpice: 1) drawing the circuit in Capture, 2) simulating it using PSpice models, and 3) analyzing output using Probe. PSpice can perform various types of circuit analyses and contains models for common circuit elements.
This document discusses the architectures and applications of CPLDs and FPGAs. It begins by classifying programmable logic devices and describing simple programmable logic devices like PLDs, PALs, and GALs. It then discusses more complex programmable logic devices like CPLDs, describing their architecture which consists of logic blocks, I/O blocks, and a global interconnect. Finally, it covers field programmable gate arrays including their architecture of configurable logic blocks, I/O blocks, and a programmable interconnect, as well as describing Xilinx's logic cell array architecture for FPGAs.
This document discusses MOS transistor theory, including MOS structure, ideal and non-ideal I-V characteristics, capacitance models, and delay models. It describes how MOS transistors operate in different modes depending on terminal voltages and how carrier mobility and channel charge determine current in linear and saturation regions. Non-ideal effects like velocity saturation, body effect, and leakage currents are also covered. The document concludes with discussions of pass transistors, tri-state inverters, and using resistor-capacitor models to estimate delay.
This presentation discusses the basics about how to realize logic functions using Static CMOS logic. This presentation discusses about how to realize a Boolean expression by drawing a Pull-up network and a pull-down network. It also briefs about the pass transistor logic and the concepts of weak and strong outputs.
This document provides an introduction to FPGA design fundamentals including:
- Programmable logic devices like PLDs, CPLDs, and FPGAs which allow for reconfigurable logic circuits.
- The basic architecture of FPGAs including configurable logic blocks (CLBs), input/output blocks (IOBs), and a programmable interconnect structure.
- Verilog and VHDL as common hardware description languages used for FPGA design entry and simulation.
- A simple example of designing a half-adder circuit in VHDL, including entity, architecture, and behavioral modeling style.
The document discusses CMOS fabrication which involves forming wells and transistors on a silicon substrate through photolithography, etching, and ion implantation processes. NMOS and PMOS transistors are formed by doping different regions with n-type or p-type dopants. Together, these complementary transistors are used to build basic logic gates in integrated circuits with low power consumption. The CMOS process allows for high density, low cost microchips through standard fabrication steps.
The document discusses four topics related to transistors:
1. Threshold voltage is the minimum gate voltage needed to create a conducting path between source and drain, and depends on oxide thickness, temperature, and random dopant fluctuations.
2. Latchup refers to a short circuit formed between power and ground rails in an integrated circuit, caused by interaction between parasitic bipolar transistors.
3. Electromigration is the forced movement of metal ions due to an electric field, with atoms traveling toward the positive conductor end and vacancies toward the negative end.
4. Mobility degradation occurs due to lateral and vertical electric fields scattering carriers, reducing surface mobility as channel lengths shrink.
This document discusses pass transistor logic, which uses MOS transistors to transfer charge between circuit nodes under gate control. It describes how nMOS and pMOS transistors can pass strong or weak signals depending on their configuration. Threshold voltage drops, charge sharing problems, and sneak paths that can occur in pass transistor logic circuits are also covered. The document provides examples of analyzing charge distribution before and after transistors turn on, and presents a general design for pass transistor logic gates that ensures both charging and discharging paths exist. Exercises are included on analyzing charge sharing and designing pass transistor logic circuits like majority gates and decoders.
Low Power VLSI design architecture for EDA (Electronic Design Automation) and Modern Power Estimation, Reduction and Fixing technologies including clock gating and power gating
The document provides an overview of integrated circuit fabrication processes. It discusses the basic steps including wafer production, epitaxial growth, etching, masking, doping, diffusion, implantation, and metallization. It also describes the fabrication processes for MOSFETs including NMOS, PMOS and CMOS. BiCMOS fabrication is also summarized, which combines BJT and CMOS processes to achieve high speed and low power benefits.
This document discusses digital integrated circuit design and the physical design process. It describes the key stages of digital design as electronic system level, RTL design, and physical design. Physical design involves steps like floorplanning, clustering/partitioning, placement, clock tree synthesis, and routing to lay out the design according to a technology library. Physical design categories include full custom, semi-custom, and pre-cast designs, which differ in the flexibility allowed in cell usage and placement/routing.
This document discusses important considerations for analog integrated circuit layout and the CMOS fabrication process. It covers topics like MOS transistor operation, analog signal characteristics, CMOS fabrication steps, layout techniques for minimizing noise and mismatches, and avoiding latch-up issues. The key goals of analog layout include matching devices, minimizing parasitic capacitance and resistance, isolating analog and digital sections, and using guard rings and decoupling capacitors.
Ch7 lecture slides Chenming Hu Device for ICChenming Hu
The document discusses technology scaling of MOSFETs used in integrated circuits. Key points include:
1) Feature sizes are reduced by around 30% with each new technology node to improve cost, speed, and power consumption.
2) Scaling challenges include increased subthreshold leakage current and threshold voltage roll-off.
3) Innovations such as high-k dielectrics, metal gates, strained silicon, and retrograde well doping help address these challenges and allow scaling to continue.
4) Variations in manufacturing must also be considered and techniques like multiple threshold voltages and supply voltages are used.
The document discusses MOSFET transistors. It describes their basic structure as having a gate, source and drain, with the gate separated from the semiconductor material by an insulating oxide layer. MOSFETs can be either n-channel or p-channel and either enhancement or depletion mode. Their operation depends on the voltage applied to the gate, which controls the flow of current between the source and drain. MOSFETs are widely used in applications like microprocessors and memories due to their low cost, small size and low power consumption. The CMOS inverter circuit is also discussed, which uses complementary n-channel and p-channel MOSFETs.
The document discusses circuit design processes and stick diagrams. It begins by introducing MOS layers and objectives of understanding stick diagrams, design rules, and layout. It then covers stick diagrams in depth, explaining that they show relative component placement and layer information through color codes as an interface between symbolic circuits and layouts. Examples of stick diagram rules, notations, and common MOS circuits are provided. Finally, it discusses design rules, explaining that they define feature sizes and spacings to interface between circuits and fabrication processes while allowing for manufacturing tolerances.
FPGA are a special form of Programmable logic devices(PLDs) with higher densities as compared to custom ICs and capable of implementing functionality in a short period of time using computer aided design (CAD) software....by mathewsubin3388@gmail.com
The document describes the CMOS design and fabrication process. Key points include:
- CMOS uses complementary n-type and p-type MOS transistors to reduce power consumption.
- Transistors are built on a silicon substrate using dopants to create n-type and p-type regions. PN junctions form diodes and MOS capacitors.
- The CMOS fabrication process involves layering and patterning of silicon, oxides, and metals through steps like oxidation, lithography, etching, and doping.
This document discusses SPICE (Simulation Program with Integrated Circuit Emphasis) and PSpice, a version of SPICE used for circuit simulation on PCs. It describes the basic steps for simulating a circuit using PSpice: 1) drawing the circuit in Capture, 2) simulating it using PSpice models, and 3) analyzing output using Probe. PSpice can perform various types of circuit analyses and contains models for common circuit elements.
This document discusses the architectures and applications of CPLDs and FPGAs. It begins by classifying programmable logic devices and describing simple programmable logic devices like PLDs, PALs, and GALs. It then discusses more complex programmable logic devices like CPLDs, describing their architecture which consists of logic blocks, I/O blocks, and a global interconnect. Finally, it covers field programmable gate arrays including their architecture of configurable logic blocks, I/O blocks, and a programmable interconnect, as well as describing Xilinx's logic cell array architecture for FPGAs.
This document discusses MOS transistor theory, including MOS structure, ideal and non-ideal I-V characteristics, capacitance models, and delay models. It describes how MOS transistors operate in different modes depending on terminal voltages and how carrier mobility and channel charge determine current in linear and saturation regions. Non-ideal effects like velocity saturation, body effect, and leakage currents are also covered. The document concludes with discussions of pass transistors, tri-state inverters, and using resistor-capacitor models to estimate delay.
This presentation discusses the basics about how to realize logic functions using Static CMOS logic. This presentation discusses about how to realize a Boolean expression by drawing a Pull-up network and a pull-down network. It also briefs about the pass transistor logic and the concepts of weak and strong outputs.
This document provides an introduction to FPGA design fundamentals including:
- Programmable logic devices like PLDs, CPLDs, and FPGAs which allow for reconfigurable logic circuits.
- The basic architecture of FPGAs including configurable logic blocks (CLBs), input/output blocks (IOBs), and a programmable interconnect structure.
- Verilog and VHDL as common hardware description languages used for FPGA design entry and simulation.
- A simple example of designing a half-adder circuit in VHDL, including entity, architecture, and behavioral modeling style.
The document discusses CMOS fabrication which involves forming wells and transistors on a silicon substrate through photolithography, etching, and ion implantation processes. NMOS and PMOS transistors are formed by doping different regions with n-type or p-type dopants. Together, these complementary transistors are used to build basic logic gates in integrated circuits with low power consumption. The CMOS process allows for high density, low cost microchips through standard fabrication steps.
The document discusses four topics related to transistors:
1. Threshold voltage is the minimum gate voltage needed to create a conducting path between source and drain, and depends on oxide thickness, temperature, and random dopant fluctuations.
2. Latchup refers to a short circuit formed between power and ground rails in an integrated circuit, caused by interaction between parasitic bipolar transistors.
3. Electromigration is the forced movement of metal ions due to an electric field, with atoms traveling toward the positive conductor end and vacancies toward the negative end.
4. Mobility degradation occurs due to lateral and vertical electric fields scattering carriers, reducing surface mobility as channel lengths shrink.
This document discusses pass transistor logic, which uses MOS transistors to transfer charge between circuit nodes under gate control. It describes how nMOS and pMOS transistors can pass strong or weak signals depending on their configuration. Threshold voltage drops, charge sharing problems, and sneak paths that can occur in pass transistor logic circuits are also covered. The document provides examples of analyzing charge distribution before and after transistors turn on, and presents a general design for pass transistor logic gates that ensures both charging and discharging paths exist. Exercises are included on analyzing charge sharing and designing pass transistor logic circuits like majority gates and decoders.
Low Power VLSI design architecture for EDA (Electronic Design Automation) and Modern Power Estimation, Reduction and Fixing technologies including clock gating and power gating
The document provides an overview of integrated circuit fabrication processes. It discusses the basic steps including wafer production, epitaxial growth, etching, masking, doping, diffusion, implantation, and metallization. It also describes the fabrication processes for MOSFETs including NMOS, PMOS and CMOS. BiCMOS fabrication is also summarized, which combines BJT and CMOS processes to achieve high speed and low power benefits.
This document discusses digital integrated circuit design and the physical design process. It describes the key stages of digital design as electronic system level, RTL design, and physical design. Physical design involves steps like floorplanning, clustering/partitioning, placement, clock tree synthesis, and routing to lay out the design according to a technology library. Physical design categories include full custom, semi-custom, and pre-cast designs, which differ in the flexibility allowed in cell usage and placement/routing.
This document discusses important considerations for analog integrated circuit layout and the CMOS fabrication process. It covers topics like MOS transistor operation, analog signal characteristics, CMOS fabrication steps, layout techniques for minimizing noise and mismatches, and avoiding latch-up issues. The key goals of analog layout include matching devices, minimizing parasitic capacitance and resistance, isolating analog and digital sections, and using guard rings and decoupling capacitors.
Ch7 lecture slides Chenming Hu Device for ICChenming Hu
The document discusses technology scaling of MOSFETs used in integrated circuits. Key points include:
1) Feature sizes are reduced by around 30% with each new technology node to improve cost, speed, and power consumption.
2) Scaling challenges include increased subthreshold leakage current and threshold voltage roll-off.
3) Innovations such as high-k dielectrics, metal gates, strained silicon, and retrograde well doping help address these challenges and allow scaling to continue.
4) Variations in manufacturing must also be considered and techniques like multiple threshold voltages and supply voltages are used.
The document discusses MOSFET transistors. It describes their basic structure as having a gate, source and drain, with the gate separated from the semiconductor material by an insulating oxide layer. MOSFETs can be either n-channel or p-channel and either enhancement or depletion mode. Their operation depends on the voltage applied to the gate, which controls the flow of current between the source and drain. MOSFETs are widely used in applications like microprocessors and memories due to their low cost, small size and low power consumption. The CMOS inverter circuit is also discussed, which uses complementary n-channel and p-channel MOSFETs.
VLSI circuit design involves a standardized process of scaling down transistor sizes over multiple generations. This document outlines key aspects of the VLSI design process including:
1) MOSFET layers, stick diagrams, design rules and layout diagrams are used to plan and design VLSI circuits before fabrication.
2) Stick diagrams provide a simplified cartoon view of layouts showing relative placement of transistors without exact sizes or spacings.
3) Scaling down transistor dimensions according to standard scaling factors allows more transistors to fit on chips leading to improved performance over generations, but also introduces challenges like increased interconnect delays and crosstalk.
This document provides an overview of different types of capacitors used in CMOS technology, including PN junction capacitors, MOSFET gate capacitors, and conductor-insulator-conductor capacitors. It discusses the characteristics and structures of each type of capacitor, as well as experimental results on their quality factors and variations in capacitance with voltage. PN junction capacitors are formed from diffusions and exhibit higher quality factors when using smaller island sizes. MOSFET gate capacitors have nonlinear capacitance depending on the voltage between the gate and other terminals. Conductor-insulator-conductor capacitors such as poly-poly and metal-insulator-metal capacitors provide linear capacitance with low parasitic effects.
This document discusses surround gate MOSFETs as an approach to reduce short channel effects in transistors. It begins with an overview of MOSFET operation and Moore's Law. It then discusses the motivation to find alternatives to planar transistors as scaling limits are approached. Short channel effects in bulk MOSFETs are introduced as a major barrier to scaling. The document reviews SOI and multi-gate transistor technologies, such as double gate, tri-gate, and gate-all-around designs, as ways to better control the channel and reduce short channel effects. A new dual-material surround gate structure is proposed and its potential to further suppress short channel effects through gate material engineering is explained. Two-dimensional modeling of the new structure
This document contains lecture slides on VLSI circuit design processes from the Department of Electronics and Communication Engineering at VBIT. It discusses topics like VLSI design flow, MOS layers, stick diagrams, design rules, layout diagrams for basic gates like inverters, and scaling of MOS circuits. The document provides illustrations and explanations of concepts like stick diagrams, nMOS and CMOS inverter layout, NAND gate layout, and encodings for representing different layers in VLSI design.
This document discusses design considerations for high step-down ratio buck converters. It begins with an overview of buck converter operation in continuous and discontinuous modes. It then lists typical specifications and design considerations such as input/output voltage ranges, efficiency targets, and size constraints. Improving efficiency is highlighted as critical for thermal management and reliability. Small signal modeling of the buck converter is presented, incorporating the PWM switch. Key MOSFET parameters like gate resistance and non-linear junction capacitance are also discussed.
The document describes an experiment to generate and simulate a CMOS inverter circuit layout using the Microwind CAD tool. The key steps are:
1. Select a foundry process and design the nMOS transistor by adding n-well, n+ diffusion, polysilicon, and metal contacts.
2. Design the pMOS transistor by adding an n-well, p+ diffusion, polysilicon, and contacts.
3. Interconnect the pMOS and nMOS transistors to form an inverter, connecting inputs, outputs, and power terminals.
4. Perform DRC checks and post-layout simulation to verify the inverter's transfer characteristics.
This document provides an overview of VLSI circuits and design. It discusses the evolution from transistors to integrated circuits, highlighting advantages like reduced size and cost. The VLSI design process involves problem specification, architecture definition, functional design, logic design, and physical design. CMOS technology is described, including transistor operation, fabrication, and basic gates. Dynamic CMOS uses precharge and evaluation phases to conditionally discharge outputs. Programmable logic devices like PLA, PAL, and FPGA are also summarized.
This document provides an overview of VLSI design and MOS transistor principles. It discusses why VLSI design is important due to improvements in integration, power, speed and cost. A brief history of transistor invention and integrated circuit development is given. MOS transistor operation principles including NMOS and PMOS types are explained. CMOS logic gates like inverter, NAND and NOR are described. Electrical properties of CMOS like ideal I-V characteristics are covered.
This document provides an overview of the VGT 529 VLSI design course at Universiti Malaysia Perlis. It includes:
- An outline of the course contents which covers transistor level design, fabrication, CMOS technology, layout design rules, technology related CAD tools, and manufacturing issues over 14 weeks.
- Details of the course assessments which include assignments, projects, open book tests and quizzes evaluating different levels of complexity.
- A review of MOS transistor theory including I-V characteristics, C-V characteristics, and DC transfer characteristics of an inverter.
- An overview of CMOS fabrication processes involving growing oxides, doping, depositing and etching materials over multiple levels to form
The document discusses key considerations for successfully laying out a printed circuit board for a switched-mode power supply. It covers minimizing parasitic inductance and capacitance, routing high current and high switching node paths, following EMI best practices like separating noisy and sensitive traces, implementing proper grounding techniques, and managing thermal performance. The presentation uses an example layout of a flyback converter to demonstrate these concepts in practice. It emphasizes understanding the circuit operation and identifying critical paths before systematically placing components and routing traces to achieve an optimal PCB layout.
CMOS Analog IC design by Dr GS Javed - Refresher Course - Batch 1Javed G S, PhD
Topics covered in the course
1. DC Biasing of the circuits
2. Circuits for reference voltage and current generation
-Voltage Regulator
-BGR
-LDO
-V-to-I
3. Precision Current References
4. Opamp design for Analog to digital converters
- OTA
- Buffer
- Unity Feedback OTA
- Layout design strategies – 2stage opamp + CMFB
5. Sense and Return mechanisms in Feedback circuits
- Current and Voltage circuits
6. Sub-Threshold Conduction
- Low voltage Operation
7. ADC Design and Simulation
-Near Nyquist performance of Opamp for ADC Circuits
-Spectral Analysis and No. of FFT Points for simulation
-Simulation time for performance
-Resistors – their variation and Calibration
-Switch design for S/H
-CDAC
8. On-Chip Inductors
The document discusses VLSI circuit design processes. It covers topics like VLSI design flow, MOS layers, stick diagrams, design rules and layout diagrams. It provides layout diagrams for inverters and logic gates. It also discusses scaling of MOS circuits. Stick diagrams are introduced as a way to show relative placement of transistors without exact sizing or placement details. Design rules for a 2μm CMOS process are presented.
This document outlines different types of MOS inverters used in integrated circuits. It discusses 7 main types: resistive load inverter, enhancement mode device (EMD) inverter, depletion mode device (DMD) inverter, CMOS inverter, pseudo CMOS inverter, BiCMOS inverter, and dynamic MOS inverter. For each type, it provides the circuit configuration, operating principles, advantages and disadvantages. It also gives examples of inverter symbols and their truth tables. The document aims to explain the basic concepts of MOS inverter design.
This document provides an overview of CMOS VLSI design. It begins with an introduction to CMOS technology, including the basic structure and operation of NMOS and PMOS transistors. It then discusses DC characteristics such as different operating regions and I-V curves. The document covers fabrication processes like oxidation, photolithography, and etching. It also shows cross-sections and mask views for a sample CMOS inverter, highlighting steps like forming the n-well and adding contacts, polysilicon, diffusion and metal layers.
The document provides an overview of physical design in VLSI. It discusses the VLSI design flow including specification, schematic design, layout, floorplanning, routing, and fabrication. It then describes layout considerations such as layers, design rules, DRC checks, and LVS checks. Examples of CMOS inverter, NAND and NOR gate layouts are shown. Optimization techniques for transistor sizing and drain connections are also covered. Different logic styles like pseudo-NMOS, dynamic CMOS, and domino logic are explained.
This document provides an overview of the physical design process for integrated circuits. It discusses the steps from schematic design to layout, including floorplanning, placement, routing, and design rule checking. Sample schematics and layouts are shown for basic gates like inverters, NAND gates, and transmission gates. Guidelines are provided for layout optimization to improve performance and density. The layout process involves translating the schematic into distinct layers and ensuring design rules are followed with respect to dimensions, spacing, and connectivity between layers.
This chapter discusses static CMOS circuits. It covers the goals of optimizing gate metrics like area, speed, energy and robustness. It discusses static CMOS logic families and high-performance circuit design techniques. Static CMOS circuits keep each gate output connected to either VDD or VSS at all times, unlike dynamic circuits which rely on temporary signal storage. The chapter explains how to construct static CMOS gates using pull-up and pull-down networks and discusses transistor sizing to optimize performance.
Nano-scale double-gate MOSFETs can be used in low power tunable current mode applications. Silicon-on-insulator technology reduces junction capacitance and leakage compared to bulk silicon, enabling continued device scaling. Double-gate MOSFETs suppress off-state leakage by using an adequately thin body region without body doping, allowing higher drive currents. Simulation results show identical behavior for FinFET and TriGate transistors in terms of current gain and unilateral power gain, with TriGate performance superior to FinFET. Future work includes modeling p-channel devices, understanding design constraints from fabrication tolerances, and investigating microwave characteristics.
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Layout design
1. Layout Design
Lecture 4
18-322 Fall 2003
Textbook: Design Methodology Insert A
[Portions adapted from J. P. Uyemura “Introduction to VLSI Circuits and Systems”, Wiley 2001.]
2. Roadmap
Today: Basic CMOS Layout: “design in the small”
Thursday: Layout Verification & “design in the large”
Next week:
Transistor sizing
Wires
Homework 1: Due Thursday
Homework 2: Out Thursday
Lab 2: This week
4. Review: MOSFETs
Gate (G)
No connection
G = 0
Open switchSource Drain
Source
layer
Drain
layer
Gate layer
Conduction layer
G = 1
Closed switch
G is responsible for the absence or presence of the conduction region between
the drain and the source regions
5. Review: Controlling Current Flow (nFET)
0V
p
n+ n+
No electrons
L
insulator
drain diffsource diff
VG
n+ n+W
L
Top viewSide view
+
p
n+ n+
electrons n+ n+
electron channel
6. Review: Manufacturing
2D top-down view
How design engineers see
the chip.
3D “cross-section” view
How process engineers see
the chip.
7. Design Rules
Interface between designer and process engineer
Clean separation between the process during wafer fabrication and the design
effort
⌧ Permissible geometries -> DESIGN RULES
• Width rule, space rule, overlap rule, etc.
Ways to do design rules
“Scalable Design Rules”
Absolute measures
8. Scalable Design Rules
CMOS scales
Implement something now, shrink it later
Express all design rules in terms of a unit dimension
Change the actual dimension of the unit, and the whole design shrinks
Mead and Conway
Unit dimension: Minimum line width (2λ)
In 1978, λ = 1.5 µm (a.k.a. 3 micron technology)
In 2003, λ = 0.065 µm (a.k.a. 0.13 micron technology)
Important Intellectual idea, not used in industry (but we will)
11. Absolute Design Rules
It is hard to scale every aspect of design linearly
The elegance of scalable CMOS isn’t worth the cost
Specify all dimensions in real units (µm or nm)
Currently (0.13 micron), there are THOUSANDS of
design rules
13. Inverters
Vin Vout
VDD
GND
Layout of a NOT gate
Vin Vout
GND
VDD
Vin Vout
VDD
GND
Alternate layout of a NOT gate
Transistor sizing determines inverter fundamental properties!
14. Series/Parallel Connections
A B
n+ n+ n+
A B
n+ n+ n+
A B
n+ n+ n+
p
Devices can share patterned regions; this may reduce the layout area or complexity!
A B
X
Y
A B
XX X
X
Y X
poly Red
n+/p+ Green
metal Blue
contact Black
18. NOR2 (alternate layout)
B
A
VDD
GND
NOT(A+B)
The output here is
connected to one
p-trans drain and
one n-trans drain.
VDD
GND
A
B
NOT(A+B)
This is better!
Less drain area connected to the output .
This results in a faster gate.
19. Complex Logic Gates: OAI Gates
A
B
C
D
F
A
B C D
1
2
A
B C D
1
2
#1 #2
F= NOT(A(B+C+D))
22. OAI Gates: Sharing S/D
A B C D
F
VD D
GND
A
B C D
1
2
The output here has
four output drain
capacitances.
23. Capacitance: Friend or Foe???
Foe: Slows down the output:
Friend: Stabilizes the Power Supply
Big Capacitance
More charge to
to change voltage
SLOWER!
Big Capacitance
More charge to
to change voltage
More stable supply
voltage!
26. OAI Gates: Sharing S/D
A B C D
F
V DD
GND
Wrong
A B C D
F
V DD
GND
Right
The output here has
two output drain
capacitances.
27. Gate Design Procedure
Run VDD and GND in metal at top and bottom
Run vertical poly for each gate input
Order gates to allow maximum source-drain abutting
Place max number of n-diffusions close to GND
Place max number of p-diffusions close to VDD
Make remaining connections with metal
Minimize metal usage
39. Preview: The 18-322 Flow
Boolean
function
Transistor Schematic
Schematic Simulation
Component
Design
Extracted Simulation
Layout (w/ DRC)
1st part
of the
Thursday’s
Lecture
LVS Check
40. Preview: Modern ASIC Design
Designer Productivity is a big problem
In 1978, people could draw transistors, now there are 100s of
millions per chip…
New abstractions necessary:
Masks
Layout
Design
DesignRules
CellLibraries
Std Cell
Design
18-322